Our superconducting AGOR cyclotron is a multi-particle, variable energy AVF-cyclotron
At PARTREC, we provide a wide range of high-quality particle beams tailored to meet the needs of advanced research and industrial applications.
Our state-of-the-art facilities offer proton, alpha, and heavy ion beams with customizable energy levels and intensities, ensuring precision and flexibility for every project. Whether you're conducting fundamental research or developing new technologies, our expert team is here to support your beamline needs with cutting-edge solutions.
Operating hours
Our testing facilities can operate 24 hours a day, from Monday 07.00 untill Saturday 07.00 h.
Available services
24 hours a day, 5 days a week
| Protons | Ions | |
|---|---|---|
Kinetic energy (MeV/amu) |
15 - 190 |
19.8 or 30 for cocktail of O, Ne, Ar, Kr, Xe |
Attainable flux 3 13 (particles per s) |
10³ - 10¹³ | 10³ - 10¹³ |
Field size 2 (cm ) |
≤ 10 x 10 (scanned beam) ≤ 8 x 8 (scattered beam) |
≤ 7 x 7 for light ions (scanned beam) |
Field homogeneity |
± 2 % (scattered beam) ± 1 % (scanned beam) |
± 2 % (scattered beam) ± 1 % (scanned beam) |
The table below presents details of the 30MeV/u heavy ion cocktail that we provide for commercial and scientific irradiations, including the ion species, maximum flux, energy at DUT and beam purity. Switching between any heavy ion species takes less than one hour.
| Ion Species | Maximum Flux ion cm-2 s-1 |
Energy at DUT in air (SRIM 2013) |
LET at DUT in Air (SRIM 2013) MeV/(mg/cm2) |
Max LET (SRIM 2013) Using a degraded beam MeV/(mg/cm2) |
Contamination Ions per beam ion |
|---|---|---|---|---|---|
| 16O4+ | 1E6 | 27.93 | 1.1 | 4.5 | <1E-5 |
| 20Ne5+ | 1E6 | 26.9 | 1.8 | 7.8 | <1E-5 |
| 40Ar10+ | 1E6 | 26.3 | 5.7 | 16.6 | <1E-5 |
| 84Kr21+ | 1E6 | 24.6 | 20 | 40 | <1E-5 |
| 129Xe32+ | ~1E6 | 25.5 | 42 | 65 | <1E-5 |
The heavy ion beams have a contamination less than 1E-5 and the homogeneity of field can better than 1%. The “cocktail” of oxygen, neon, argon, krypton and xenon all have a charge of mass ratio of about 0.25 which means that we can switch between beams within one hour.
LET Function in Silicon
The tool below allows you to plot Linear Energy Transfer (LET) in silicon for different ion types, ion beam energies, aluminium degrader thicknesses and air gaps between the beam line exit window and the Device Under Test (DUT). Please select the parameters and click “Add to plot” to display the LET function. You can always remove the last plotted graph by clicking the “Undo” button, and reset the tool by clicking the “Reset” button.